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SN74ABT8646DLR データシート(PDF) 2 Page - Texas Instruments

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部品番号 SN74ABT8646DLR
部品情報  SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
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メーカー  TI [Texas Instruments]
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SN74ABT8646DLR データシート(HTML) 2 Page - Texas Instruments

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SN54ABT8646, SN74ABT8646
SCAN TEST DEVICES WITH
OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS123F − AUGUST 1992 − REVISED APRIL 2004
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Transceiver function is controlled by output-enable (OE) and direction (DIR) inputs. When OE is low, the
transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR
is low. When OE is high, both the A and B outputs are in the high-impedance state, effectively isolating both
buses.
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is
clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data
is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for
presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB
and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that can be performed
with the ’ABT8646.
In the test mode, the normal operation of the SCOPE
 bus transceivers and registers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO),
test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions
such as parallel-signature analysis (PSA) on data inputs and pseudorandom pattern generation (PRPG) from
data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54ABT8646 is characterized for operation over the full military temperature range of −55
°C to 125°C.
The SN74ABT8646 is characterized for operation from −40
°C to 85°C.
FUNCTION TABLE
INPUTS
DATA I/O
OPERATION OR FUNCTION
OE
DIR
CLKAB
CLKBA
SAB
SBA
A1−A8
B1−B8
OPERATION OR FUNCTION
X
X
X
X
X
Input
Unspecified†
Store A, B unspecified†
X
XX
X
X
Unspecified†
Input
Store B, A unspecified†
H
X
X
X
Input
Input
Store A and B data
H
X
H or L
H or L
X
X
Input disabled
Input disabled
Isolation, hold storage
L
L
X
X
X
L
Output
Input
Real-time B data to A bus
L
L
X
H or L
X
H
Output
Input disabled
Stored B data to A bus
L
H
X
X
L
X
Input
Output
Real-time A data to B bus
L
H
H or L
X
H
X
Input disabled
Output
Stored A data to B bus
† The data-output functions can be enabled or disabled by various signals at OE and DIR. Data-input functions are always enabled; i.e., data at
the bus pins is stored on every low-to-high transition of the clock inputs.


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