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LM3743MM-300 データシート(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部品番号 LM3743MM-300
部品情報  N-Channel FET Synchronous Buck Controller for Low Output Voltages
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メーカー  NSC [National Semiconductor (TI)]
ホームページ  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM3743MM-300 データシート(HTML) 4 Page - National Semiconductor (TI)

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Electrical Characteristics V
CC = 3.3V, COMP/EN floating unless otherwise indicated in the conditions
column. Limits in standard type are for T
J = 25˚C only; limits in boldface type apply over the junction temperature (TJ) range of
-40˚C to +125˚C. Minimum and Maximum limits are guaranteed through test, design, or statistical correlation. Typical values
represent the most likely parametric norm at T
J = 25˚C, and are provided for reference purposes only. (Continued)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
V
RAMP
PWM Ramp Amplitude
1.0
V
LOGIC INPUTS AND OUTPUTS
V
COMP/EN-HI COMP/EN pin logic high trip-point
0.65
0.9
V
V
COMP/EN-LO COMP/EN pin logic low trip-point
0.1
0.45
V
HICCUP MODE
N
LSCYCLES
Low-side sensing cycles before hiccup
mode
15
Cycles
N
LSRESET
Low-side sensing cycles reset without
activating current limit
32
Cycles
V
UVP
Under Voltage Protection comparator
threshold
400
mV
t
GLICH-UVP
Under Voltage Protection fault time before
hiccup mode
7µs
t
HICCUP
Hiccup timeout
5.5
ms
t
SS
Soft-start time coming out of hiccup mode
3.6
ms
THERMAL RESISTANCE
θ
JA
Junction to Ambient Thermal Resistance
235
˚C/W
Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating ratings indicate conditions for which the device
operates correctly. Operating Ratings do not imply guaranteed performance limits.
Note 2: Practical lower limit of VCC depends on selection of the external MOSFET. See the MOSFET GATE DRIVERS section under Application Information for
further details.
Note 3: ESD using the human body model which is a 100 pF capacitor discharged through a 1.5 k
Ω resistor into each pin. Test method is per JESD22–A114.
www.national.com
4


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