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74AUP1G97GW データシート(PDF) 1 Page - NXP Semiconductors |
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74AUP1G97GW データシート(HTML) 1 Page - NXP Semiconductors |
1 / 19 page 1. General description The 74AUP1G97 is a high-performance, low-power, low-voltage, Si-gate CMOS device, superior to most advanced CMOS compatible TTL families. This device ensures a very low static and dynamic power consumption across the entire VCC range from 0.8 V to 3.6 V. This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry disables the output, preventing the damaging backflow current through the device when it is powered down. The 74AUP1G97 provides configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter and buffer. All inputs can be connected to VCC or GND. Schmitt trigger action at all inputs makes the circuit tolerant to slower input rise and fall times across the entire VCC range from 0.8 V to 3.6 V. The inputs switch at different points for positive and negative-going signals. The difference between the positive voltage VT+ and the negative voltage VT− is defined as the input hysteresis voltage VH. 2. Features s Wide supply voltage range from 0.8 V to 3.6 V s High noise immunity s ESD protection: x HBM JESD22-A114-D Class 3A exceeds 5000 V x MM JESD22-A115-A exceeds 200 V x CDM JESD22-C101-C exceeds 1000 V s Low static power consumption; ICC = 0.9 µA (maximum) s Latch-up performance exceeds 100 mA per JESD 78 Class II s Inputs accept voltages up to 3.6 V s Low noise overshoot and undershoot < 10 % of VCC s IOFF circuitry provides partial Power-down mode operation s Multiple package options s Specified from −40 °Cto+85 °C and −40 °C to +125 °C 74AUP1G97 Low-power configurable multiple function gate Rev. 01 — 7 November 2006 Product data sheet |
同様の部品番号 - 74AUP1G97GW |
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同様の説明 - 74AUP1G97GW |
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