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KM641003C-20 データシート(PDF) 4 Page - Samsung semiconductor |
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KM641003C-20 データシート(HTML) 4 Page - Samsung semiconductor |
4 / 8 page KM641003C PRELIMINARY Revision 1.0 - 4 - March 1999 CCPCCCRCELIMINARY Preliminary CMOS SRAM PRELIMINARY TEST CONDITIONS Parameter Value Input Pulse Levels 0V to 3V Input Rise and Fall Times 3ns Input and Output timing Reference Levels 1.5V Output Loads See below AC CHARACTERISTICS(TA=0 to 70 °C, VCC=5.0V±10%, unless otherwise noted.) READ CYCLE Parameter Symbol KM641003C-12 KM641003C-15 KM641003C-20 Unit Min Max Min Max Min Max Read Cycle Time tRC 12 - 15 - 20 - ns Address Access Time tAA - 12 - 15 - 20 ns Chip Select to Output tCO - 12 - 15 - 20 ns Output Enable to Valid Output tOE - 6 - 7 - 9 ns Chip Enable to Low-Z Output tLZ 3 - 3 - 3 - ns Output Enable to Low-Z Output tOLZ 0 - 0 - 0 - ns Chip Disable to High-Z Output tHZ 0 6 - 7 - 9 ns Output Disable to High-Z Output tOHZ 0 6 0 7 0 9 ns Output Hold from Address Change tOH 3 - 3 - 3 - ns Chip Selection to Power Up Time tPU 0 - 0 - 0 - ns Chip Selection to Power DownTime tPD - 12 - 15 - 20 ns Output Loads(B) DOUT 5pF* 480 Ω 255 Ω for tHZ, tLZ, tWHZ, tOW, tOLZ & tOHZ +5.0V * Including Scope and Jig Capacitance Output Loads(A) DOUT RL = 50 Ω ZO = 50 Ω VL = 1.5V 30pF* * Capacitive Load consists of all components of the test environment. |
同様の部品番号 - KM641003C-20 |
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同様の説明 - KM641003C-20 |
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