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MC100EP195FAR2G データシート(PDF) 7 Page - ON Semiconductor

部品番号 MC100EP195FAR2G
部品情報  3.3V ECL Programmable Delay Chip
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メーカー  ONSEMI [ON Semiconductor]
ホームページ  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC100EP195FAR2G データシート(HTML) 7 Page - ON Semiconductor

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MC10EP195, MC100EP195
http://onsemi.com
7
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900.0 1000.0
Decimal Value of Select Inputs (D[9:0])
85°C
−40°C
Figure 4. Measured Delay vs. Select Inputs
25°C
VCC = 0 V
VEE = −3.3 V
Table 7. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
Positive Mode Power Supply
VEE = 0 V
6
V
VEE
Negative Mode Power Supply
VCC = 0 V
−6
V
VI
Positive Mode Input Voltage
Negative Mode Input Voltage
VEE = 0 V
VCC = 0 V
VI ≤ VCC
VI ≥ VEE
6
−6
V
V
Iout
Output Current
Continuous
Surge
50
100
mA
mA
IBB
VBB Sink/Source
±0.5
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
LQFP−23
LQFP−23
80
55
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
LQFP−23
12 to 17
°C/W
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
QFN−32
QFN−32
31
27
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
2S2P
QFN−32
12
°C/W
Tsol
Wave Solder
Pb
Pb−Free
<2 to 3 sec @ 248°C
<2 to 3 sec @ 260°C
265
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.


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