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MC100LVEL37 データシート(PDF) 2 Page - ON Semiconductor

部品番号 MC100LVEL37
部品情報  3.3V ECL 1:4 첨1/첨2 Clock Fanout Buffer
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メーカー  ONSEMI [ON Semiconductor]
ホームページ  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC100LVEL37 データシート(HTML) 2 Page - ON Semiconductor

  MC100LVEL37 Datasheet HTML 1Page - ON Semiconductor MC100LVEL37 Datasheet HTML 2Page - ON Semiconductor MC100LVEL37 Datasheet HTML 3Page - ON Semiconductor MC100LVEL37 Datasheet HTML 4Page - ON Semiconductor MC100LVEL37 Datasheet HTML 5Page - ON Semiconductor MC100LVEL37 Datasheet HTML 6Page - ON Semiconductor  
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MC100LVEL37
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2
Figure 1. 20−Lead Pinout (Top View)
Q0
Q0
Q1
Q1
Q2
Q2
Q3
Q3
VCC CLK0 CLK0 Clk_Sel CLK1 CLK1 MR
VEE
19
20
18
17
16
15
14
2
1
34567
VEE
13
8
12
9
11
10
VCC
VCC
VEE
÷
1 ÷2
Warning: All VCC and VEE pins must be externally connected
to Power Supply to guarantee proper operation.
FUNCTION
ECL Differential Clock ÷1 Outputs
ECL Differential Clock ÷2 Outputs
ECL Differential Clock Inputs
ECL Input Clock Selection
ECL Asynchronous Master Reset
Positive Supply
Negative Supply
PIN
Q0, Q0; Q1, Q1
Q2, Q2; Q3, Q3
CLKn, CLKn
Clk_Sel
MR
VCC
VEE
MR
L
L
H
Clk_Sel
L
H
X
Q0, 1
CLK0/÷1
CLK1/÷1
L
X = Don’t Care
Q2, 3
CLK0/÷2
CLK1/÷2
L
Table 1. TRUTH TABLE
Table 2. PIN DESCRIPTION
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
PECL Mode Power Supply
VEE = 0 V
8 to 0
V
VEE
NECL Mode Power Supply
VCC = 0 V
−8 to 0
V
VI
PECL Mode Input Voltage
NECL Mode Input Voltage
VEE = 0 V
VCC = 0 V
VI  VCC
VI  VEE
6 to 0
−6 to 0
V
V
Iout
Output Current
Continuous
Surge
50
100
mA
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction to Ambient)
0 lfpm
500 lfpm
20 SOIC
20 SOIC
90
60
°C/W
°C/W
qJC
Thermal Resistance (Junction to Case)
Standard Board
20 SOIC
30 to 35
°C/W
Tsol
Wave Solder
Pb
Pb−Free
<2 to 3 sec @ 248°C
<2 to 3 sec @ 260°C
265
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may
affect device reliability.


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