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MC100LVEL38DWG データシート(PDF) 3 Page - ON Semiconductor |
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MC100LVEL38DWG データシート(HTML) 3 Page - ON Semiconductor |
3 / 7 page MC100LVEL38 http://onsemi.com 3 CLK Q (÷2) Q (÷4) Q (÷6) Phase_Out (÷4) Phase_Out (÷6) Figure 3. Timing Diagrams Table 3. MAXIMUM RATINGS Symbol Parameter Condition 1 Condition 2 Rating Unit VCC PECL Mode Power Supply VEE = 0 V 8 to 0 V VEE NECL Mode Power Supply VCC = 0 V −8 to 0 V VI PECL Mode Input Voltage NECL Mode Input Voltage VEE = 0 V VCC = 0 V VI VCC VI VEE 6 to 0 −6 to 0 V V Iout Output Current Continuous Surge 50 100 mA mA IBB VBB Sink/Source ± 0.5 mA TA Operating Temperature Range −40 to +85 °C Tstg Storage Temperature Range −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm SOIC−20 SOIC−20 90 60 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) Standard Board SOIC−20 30 to 35 °C/W Tsol Wave Solder Pb Pb−Free <2 to 3 sec @ 248°C <2 to 3 sec @ 260°C 265 265 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
同様の部品番号 - MC100LVEL38DWG |
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同様の説明 - MC100LVEL38DWG |
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