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M27C1024-12B6X データシート(PDF) 4 Page - STMicroelectronics

部品番号 M27C1024-12B6X
部品情報  1 Mbit (64Kb x16) UV EPROM and OTP EPROM
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

M27C1024-12B6X データシート(HTML) 4 Page - STMicroelectronics

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AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
Figure 3. AC Testing Input Output Waveform
AI01823B
1.3V
OUT
CL
CL = 30pF for High Speed
CL = 100pF for Standard
CL includes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
Figure 4. AC Testing Load Circuit
High Speed
Standard
Input Rise and Fall Times
≤ 10ns
≤ 20ns
Input Pulse Voltages
0 to 3V
0.4V to 2.4V
Input and Output Timing Ref. Voltages
1.5V
0.8V and 2V
Table 5. AC Measurement Conditions
Symbol
Parameter
Test Condition
Min
Max
Unit
CIN
Input Capacitance
VIN =0V
6
pF
COUT
Output Capacitance
VOUT =0V
12
pF
Note: 1. Sampled only, not 100% tested.
Table 6. Capacitance (1) (TA =25
°C, f = 1 MHz )
Two Line Output Control
BecauseEPROMs are usually used in largermem-
ory arrays, this product features a 2 line control
function which accommodates the use of multiple
memory connection. The two line control function
allows:
a. the lowest possible memory power dissipation,
b. complete assurance that output bus contention
will not occur.
For the most efficient use of thesetwo control lines,
E should be decoded and used as the primary
device selecting function, while G should be made
a common connection to all devices in the array
and connected to the READ line from the system
control bus. This ensures that all deselected mem-
ory devices are in their low power standby mode
and that the output pins are only active when data
is required from a particular memory device.
System Considerations
The power switching characteristics of Advanced
CMOS EPROMs require careful decoupling of the
devices. The supply current, ICC, has three seg-
ments that are of interest to the system designer :
the standby current level, the active current level,
and transient current peaks that are produced by
the falling and rising edges of E. The magnitude of
transientcurrent peaks is dependenton the capaci-
tive and inductive loading of the device at the
output.
4/15
M27C1024


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