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74LVC1G157GV データシート(PDF) 8 Page - NXP Semiconductors |
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74LVC1G157GV データシート(HTML) 8 Page - NXP Semiconductors |
8 / 15 page 74LVC1G157_3 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 03 — 12 July 2007 8 of 15 NXP Semiconductors 74LVC1G157 Single 2-input multiplexer Test data is given in Table 10. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance; should be equal to the output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 9. Load circuit for switching times VEXT VCC VI VO mna616 DUT CL RT RL RL PULSE GENERATOR Table 10. Test data Supply voltage Input Load VEXT VCC VI tr =tf CL RL tPLH, tPHL 1.65 V to 1.95 V VCC ≤ 2.0 ns 30 pF 1 k Ω open 2.3 V to 2.7 V VCC ≤ 2.0 ns 30 pF 500 Ω open 2.7 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 3.0 V to 3.6 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 4.5 V to 5.5 V VCC ≤ 2.5 ns 50 pF 500 Ω open |
同様の部品番号 - 74LVC1G157GV |
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同様の説明 - 74LVC1G157GV |
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