データシートサーチシステム |
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TLP113 データシート(PDF) 5 Page - Toshiba Semiconductor |
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TLP113 データシート(HTML) 5 Page - Toshiba Semiconductor |
5 / 8 page TLP113 2007-10-01 5 Test Circuit 1: Switching Time Test Circuit CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 2: Common Mode Transient Immunity Test Circuit s) μ ( f t 160(V) = L CΜ s) μ ( r t 160(V) = Η CΜ , CL is approximately 15pF which includes probe and stray wiring capacitance. 16mA 8mA 0mA 5V 4.5V 1.5V 0.5V VOL tpLH tpHL tf tr VO IF VO Output monitor VCC = 5V VCC GND CL Pulse input PW = 100μs Duty ratio = 1 / 10 IF monitor 200V 90% 0V 5V 2V 0.8V VOL tr tf VO VCM VO Output monitor VCC = 5V VCC GND CL Pulse gen ZO = 50Ω VCM IF 10% VO (IF = 10mA) (IF = 0mA) |
同様の部品番号 - TLP113_07 |
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同様の説明 - TLP113_07 |
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