HCF4042 datasheet(4/13 Pages) STMICROELECTRONICS

部品番号	HCF4042

部品情報	QUAD CLOCKED D LATCH

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DYNAMIC ELECTRICAL CHARACTERISTICS (T amb =25°C, CL = 50pF, RL = 200kΩ,

typical temperature coefficient for all VDD values is 0.3%/°C, all input rise and fall times = 20ns)

Test Conditions

Val ue

Symbol

Parameter

V DD ( V ) Min.

Typ.

Max.

Unit

t PLH,tPHL

Propagation Delay

Time

Data in to Q

5

110

220

ns

10

55

110

15

40

80

Data in to Q

5

150

300

10

75

150

15

50

100

Clock to Q

5

225

450

10

100

200

15

80

160

Clock to Q

5

250

500

10

115

230

15

90

180

STATIC ELECTRICAL CHARACTERISTICS (continued)

Test Conditions

Value

V I

V O

|I O |V DD

T Lo w*

25

°CT

Hi g h *

Symbol

Parameter

(V)

(

µA) (V)

Min. Max. Min. Typ. Max. Min. Max.

Unit

VIL

Input Low

Voltage

4.5/0.5

< 1

5

1.5

V

9/1

< 1

10

3

13.5/1.5

< 1

15

4

I OH

Output

Drive

Current

HCC

Types

0/ 5

2.5

5

– 2

– 1.6 – 3.2

– 1.15

mA

0/ 5

4.6

5

– 0.64

– 0.51 – 1

– 0.36

0/10

9.5

10

– 1.6

– 1.3 – 2.6

– 0.9

0/15

13.5

15

– 4.2

– 3.4 – 6.8

– 2.4

HCF

Types

0/ 5

2.5

5

– 1.53

– 1.36 – 3.2

– 1.1

0/ 5

4.6

5

– 0.52

– 0.44 – 1

– 0.36

0/10

9.5

10

– 1.3

– 1.1 – 2.6

– 0.9

0/15

13.5

15

– 3.6

– 3.0 – 6.8

– 2.4

I OL

Output

Sink

Current

HCC

Types

0/ 5

0.4

5

0.64

0.51

1

0.36

mA

0/10

0.5

10

1.6

1.3

2.6

0.9

0/15

1.5

15

4.2

3.4

6.8

2.4

HCF

Types

0/ 5

0.4

5

0.52

0.44

1

0.36

0/10

0.5

10

1.3

1.1

2.6

0.9

0/15

1.5

15

3.6

3.0

6.8

2.4

I IH,IIL

Input

leakage

Curent

HCC

Types

0/18

Any Input

18

± 0.1

±10 -5 ± 0.1

± 1

µA

HCF

Types

0/15

15

± 0.3

±10 -5 ± 0.3

± 1

CI

Input Capacitance

Any Input

5

7.5

pF

*TLow =– 55

°Cfor HCC device : – 40°C for HCF device.

*THigh = + 125

°Cfor HCC device : + 85°Cfor HCF device.

The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5V min. with VDD =15V.

HCC/HCF4042B

4/13

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