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LM1237 データシート(PDF) 5 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部品番号 LM1237
部品情報  150 MHz I2C Compatible RGB Preamplifier with Internal 254 Character OSD and 4 DACs
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メーカー  NSC [National Semiconductor (TI)]
ホームページ  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM1237 データシート(HTML) 5 Page - National Semiconductor (TI)

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System Interface Signal Characteristics (Continued)
Note 2: Limits of operating ratings indicate required boundaries of conditions for which the device is functional, but may not meet specific performance limits.
Note 3: All voltages are measured with respect to GND, unless otherwise specified.
Note 4: Human body model, 100 pF discharged through a 1.5 k
Ω resistor.
Note 5: Input from signal generator: tr,tf < 1 ns.
Note 6: Typical specifications are specified at +25˚C and represent the most likely parametric norm.
Note 7: Tested limits are guaranteed to National’s AOQL; (Average Outgoing Quality Level).
Note 8: The supply current specified is the quiescent current for VCC and 5V Dig with RL = . Load resistors are not required and are not used in the test circuit,
therefore all the supply current is used by the pre-amp.
Note 9: Linearity Error is the maximum variation in step height of a 16 step staircase input signal waveform with a 0.7 VP-P level at the input. All 16 steps equal,
with each at least 100 ns in duration.
Note 10: dt/dVCC = 200*(t5.5V–t4.5V)/ ((t5.5V + t4.5V)) %/V, where:
t5.5V is the rise or fall time at VCC = 5.5V, and t4.5V is the rise or fall time at VCC = 4.5V.
Note 11:
∆AV track is a measure of the ability of any two amplifiers to track each other and quantifies the matching of the three gain stages. It is the difference in
gain change between any two amplifiers with the contrast set to AVC−50% and measured relative to the AV max condition. For example, at AV max the three
amplifiers’ gains might be 12.1 dB, 11.9 dB, and 11.8 dB and change to 2.2 dB, 1.9 dB and 1.7 dB respectively for contrast set to AVC−50%. This yields a typical
gain change of 10.0 dB with a tracking change of ±0.2 dB.
Note 12: ABL should provide smooth decrease in gain over the operational range of 0 dB to −5 dB
∆AABL = A(VABL =VABL MAX GAIN)– A (VABL =VABL MIN GAIN)
Beyond −5 dB the gain characteristics, linearity and pulse response may depart from normal values.
Note 13: Machine Model ESD test is covered by specification EIAJ IC-121-1981. A 200 pF cap is charged to the specific voltage, then discharged directly into the
IC with no external series resistor (resistance of discharge path must be under 50
Ω).
Note 14: Measure output levels of the other two undriven amplifiers relative to the driven amplifier to determine channel separation. Terminate the undriven amplifier
inputs to simulate generator loading. Repeat test at fIN = 10 MHz for VSEP 10 MHZ.
Note 15: A minimum pulse width of 200 ns is the guaranteed minimum for a horizontal line of 15 kHz. This limit is guaranteed by design. If a lower line rate is used
then a longer clamp pulse may be required.
Note 16: Adjust input frequency from 10 MHz (AV max reference level) to the −3 dB corner frequency (f−3 dB).
Note 17: Once the spot killer has been activated, the LM1237 remains in the off state until VCC is cycled (reduced below 0.5V andthen restored to 5V).
Hexadecimal and Binary Notation
Hexadecimal numbers appear frequently throughout this document, representing slave and register addresses, and register
values. These appear in the format “0x...”. For example, the slave address for writing the registers of the LM1237 is hexadecimal
BA, written as 0xBA. On the other hand, binary values, where the individual bit values are shown, are indicated by a trailing “b”.
For example, 0xBA is equal to 10111010b. A subset of bits within a register is referred to by the bit numbers in brackets following
the register value. For example, the OSD contrast bits are the fourth and fifth bits of register 0x8438. Since the first bit is bit 0,
the OSD contrast register is 0x8438[4:3].
Register Test Settings
Table 1 shows the definitions of the Test Settings 1–8 referred to in the specifications sections. Each test setting is a combination
of five hexadecimal register values, Contrast, Gain (Blue, Red, Green) and DC offset.
TABLE 1. Test Setting Definitions
Control
No. of Bits
Test Settings
1234
567
8
Contrast
7
0x7F
(Max)
0x00
Min
0x7F
(Max)
0x7F
(Max)
0x40
(50.4%)
0x7F
(Max)
0x7F
(Max)
0x7F
(Max)
B, R, G
Gain
7
0x7F
(Max)
0x7F
(Max)
0x7F
(Max)
Set V
O to
2V
P-P
0x7F
(Max)
0x40
(50%)
0x00
(Min)
0x7F
(Max)
DC Offset
3
0x00
(Min)
0x05
0x07
(Max)
0x05
0x05
0x05
0x05
0x05
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