ISO721M-EP

over recommended operating conditions (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Quiescent

0.3

0.5

mA

25 Mbps

1

2

Quiescent

4

6.5

mA

25 Mbps

5

7.5

3

High-level output voltage

V

3.3

0.2

0.4

Low-level output voltage

V

0

0.1

150

mV

High-level input current

IN at 2 V

10

µA

Low-level input current

IN at 0.8 V

–10

High-impedance output

ISO722, ISO722M

1

µA

current

Input capacitance to ground

1

pF

CMTI

Common-mode transient immunity

25

40

kV/

µs

over recommended operating conditions (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Propagation delay, low-to-high-level output

20

Propagation delay , high-to-low-level output

ISO72x

20

ns

0.5

EN at 0 V,

See Figure 1

Propagation delay, low-to-high-level output

3

12

25

Propagation delay, high-to-low-level output

ISO721M

3

12

25

0.5

1

(1)

Part-to-part skew

5

ns

Output signal rise time

2

EN at 0 V,

ns

See Figure 1

Output signal fall time

2

Sleep-mode propagation delay,

13

ns

high-level-to-high-mpedance output

See Figure 2

Sleep-mode propagation delay,

6

µs

high-impedance-to-high-level output

ISO722

ISO722M

Sleep-mode propagation delay,

13

ns

low-level-to-high-impedance output

See Figure 3

Sleep-mode propagation delay,

6

µs

high-impedance-to-low-level output

Failsafe output delay time from input power loss

See Figure 4

3

µs

100 Mbps NRZ data input, See Figure 6

2

ISO72x

100 Mbps unrestricted bit run length data

3

input, See Figure 6

Peak-to-peak eye-pattern jitter

ns

150 Mbps NRZ data input, See Figure 6

1

ISO72xM 150 Mbps unrestricted bit run length data

2

input, See Figure 6

(1)

operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.

8

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