74VHC132TTR datasheet(4/11 Pages) STMICROELECTRONICS

部品番号	74VHC132TTR

部品情報	QUAD 2-INPUT SCHMITT NAND GATE

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74VHC132

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Table 8: Capacitive Characteristics

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per gate)

Table 9: Dynamic Switching Characteristics

1) Worst case package.

2) Max number of outputs defined as (n). Data inputs are driven 0V to 5.0V, (n-1) outputs switching and one output at GND.

3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (VILD), 0V to threshold

(VIHD), f=1MHz.

Figure 3: Test Circuit

CL =15/50pF or equivalent (includes jig and probe capacitance)

RT = ZOUT of pulse generator (typically 50Ω)

Symbol

Parameter

Test Condition

Value

Unit

TA = 25°C

-40 to 85°C

-55 to 125°C

Min.

Typ.

Max.

Min.

Max.

Min.

Max.

CIN

Input Capacitance

610

10

pF

CPD

Power Dissipation

Capacitance

(note 1)

16

pF

Symbol

Parameter

Test Condition

Value

Unit

VCC

(V)

TA = 25°C

-40 to 85°C

-55 to 125°C

Min.

Typ.

Max.

Min.

Max.

Min.

Max.

VOLP

Dynamic Low

Voltage Quiet

Output (note 1, 2)

5.0

CL = 50 pF

0.3

0.8

V

VOLV

-0.8

-0.3

VIHD

Dynamic High

Voltage Input

(note 1, 3)

5.0

3.5

V

VILD

Dynamic Low

Voltage Input

(note 1, 3)

5.0

1.5

V

同様の部品番号 - 74VHC132TTR

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