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FOD4116SDV データシート(PDF) 2 Page - Fairchild Semiconductor

部品番号 FOD4116SDV
部品情報  6-Pin DIP Zero-Cross Triac Drivers
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メーカー  FAIRCHILD [Fairchild Semiconductor]
ホームページ  http://www.fairchildsemi.com
Logo FAIRCHILD - Fairchild Semiconductor

FOD4116SDV データシート(HTML) 2 Page - Fairchild Semiconductor

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©2004 Fairchild Semiconductor Corporation
www.fairchildsemi.com
FOD410, FOD4108, FOD4116, FOD4118 Rev. 1.1.4
2
Absolute Maximum Ratings (T
A = 25°C unless otherwise noted)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Note:
1. Isolation voltage, VISO, is an internal device dielectric breakdown rating. For this test, Pins 1, 2 and 3 are common,
and Pins 4, 5 and 6 are common.
Symbol
Parameters
Device
Value
Units
TOTAL DEVICE
TSTG
Storage Temperature
All
-55 to +150
°C
TOPR
Operating Temperature
All
-55 to +100
°C
TSOL
Lead Solder Temperature (Wave)
All
260 for 10 sec
°C
TJ
Junction Temperature Range
All
125
°C
VISO
Isolation Test Voltage(1)
(rms AC voltage, 60Hz, 1 min. duration)
All
5000
Vac(rms)
PD
Total Device Power Dissipation @ 25°C
Derate above 25°C
All
500
mW
8.3
mW/°C
EMITTER
IF
Continuous Forward Current
All
30
mA
VR
Reverse Voltage
All
6
V
PD
Total Power Dissipation 25°C Ambient
Derate above 25°C
All
50
mW
5.4
mW/°C
DETECTOR
VDRM
Off-State Output Terminal Voltage
FOD410, FOD4116
600
V
FOD4108, FOD4118
800
ITSM
Peak Non-Repetitive Surge Current
(single cycle 60Hz sine wave)
All
3
A
ITM
Peak On-State Current
All
300
mA
PD
Total Power Dissipation @ 25°C Ambient
Derate above 25°C
All
450
mW
6.25
mW/°C


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