データシートサーチシステム |
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ISL54215IRUZ-T データシート(PDF) 6 Page - Intersil Corporation |
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ISL54215IRUZ-T データシート(HTML) 6 Page - Intersil Corporation |
6 / 15 page 6 November 25, 2008 Test Circuits and Waveforms Logic input waveform is inverted for switches that have the opposite logic sense. FIGURE 1A. MEASUREMENT POINTS Repeat test for all switches. CL includes fixture and stray capacitance. FIGURE 1B. TEST CIRCUIT FIGURE 1. SWITCHING TIMES FIGURE 2A. MEASUREMENT POINTS Repeat test for all switches. CL includes fixture and stray capacitance. FIGURE 2B. TEST CIRCUIT FIGURE 2. BREAK-BEFORE-MAKE TIME FIGURE 3. AUDIO rON TEST CIRCUIT FIGURE 4. USB rON TEST CIRCUIT 50% tr < 20ns tf < 20ns tOFF 90% VINH 0V VINPUT VINL tON LOGIC INPUT SWITCH INPUT SWITCH OUTPUT 90% VOUT V OUT V (INPUT) R L R L r ON + ------------------------ = SWITCH INPUT VIN VOUT RL CL COMx AUDIO OR USB IN 50 Ω 10pF GND VDD C CTRL VINPUT 90% VINH VINL tD LOGIC INPUT SWITCH OUTPUT 0V VOUT VIN IN COMx RL CL VOUT 10pF 50 Ω D- OR D+ L OR R VDD GND VINPUT C CTRL VDD C 0V OR FLOAT L OR R COMx IN GND VL OR VR V1 rON = V1/40mA 40mA Repeat test for all switches. CTRL VDD C VDD D- OR D+ COMx IN GND VD- OR VD+ V1 rON = V1/40mA 40mA Repeat test for all switches. CTRL ISL54215 |
同様の部品番号 - ISL54215IRUZ-T |
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同様の説明 - ISL54215IRUZ-T |
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