データシートサーチシステム |
|
SN74ABT18245ADGG データシート(PDF) 2 Page - Texas Instruments |
|
SN74ABT18245ADGG データシート(HTML) 2 Page - Texas Instruments |
2 / 28 page SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 description (continued) Four dedicated test pins observe and control the operation of the test circuitry: test-data input (TDI), test-data output (TDO), test-mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT18245A is characterized for operation over the full military temperature range of –55 °C to 125°C. The SN74ABT18245A is characterized for operation from –40 °C to 85°C. FUNCTION TABLE (normal mode, each 9-bit section) INPUTS OPERATION OE DIR OPERATION L L B data to A bus L H A data to B bus H X Isolation |
同様の部品番号 - SN74ABT18245ADGG |
|
同様の説明 - SN74ABT18245ADGG |
|
|
リンク URL |
プライバシーポリシー |
ALLDATASHEET.JP |
ALLDATASHEETはお客様のビジネスに役立ちますか? [ DONATE ] |
Alldatasheetは | 広告 | お問い合わせ | プライバシーポリシー | リンク交換 | メーカーリスト All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |