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SN74ACT8997 データシート(PDF) 3 Page - Texas Instruments |
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SN74ACT8997 データシート(HTML) 3 Page - Texas Instruments |
3 / 28 page SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS SCAS157D – APRIL 1990 – REVISED DECEMBER 1996 3 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 functional block description The ’ACT8997 is intended to link secondary scan paths for inclusion in a primary scan path. Any combination of the four secondary scan paths can be linked, or the device can be bypassed entirely. The least-significant bit (LSB) of any value scanned into any register of the device is the first bit shifted in (nearest to TDO). The most-significant bit (MSB) is the last bit shifted in (nearest to TDI). The ’ACT8997 is divided into functional blocks as detailed below. test port The test port decodes the signals on TCK, TMS, and TRST to control the operation of the circuit. The test port includes a TAP controller that issues the proper control instructions to the data registers according to the IEEE Standard 1149.1 protocol. The TAP controller state diagram is shown in Figure 1. instruction register The instruction register (IR) is an 8-bit-wide serial-shift register that issues commands to the device. Data is input to the instruction register via TDI (or one of the DTDI pins) and shifted out via TDO. All device operations are initiated by loading the proper instruction or sequence of instructions into the IR. data registers Six parallel data registers are included in the ’ACT8997: bypass, control, counter, boundary-scan, ID-bus, and select. The ID bus register is a part of the boundary-scan register. Each data register is serially loaded via TDI or DTDI and outputs data via TDO. Table 1 summarizes the registers in the ’ACT8997. scan-path-configuration circuit This circuit decodes bits in the select and control registers to determine which, if any, of the secondary scan paths are to be included in the primary scan path. Table 1. Register Summary REGISTER NAME LENGTH (BITS) FUNCTION Instruction 8 Issue command information to the device Control 10 Configuration and enable control Counter 8 Count events on DCI, output interrupts via DCO Select 8 Select one or more secondary scan paths Boundary Scan 10 Capture and force test data at device periphery ID Bus 4 Provide subsystem identification code Bypass 1 Remove the ’ACT8997 from the scan path |
同様の部品番号 - SN74ACT8997 |
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同様の説明 - SN74ACT8997 |
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