データシートサーチシステム |
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ISL54223 データシート(PDF) 5 Page - Intersil Corporation |
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ISL54223 データシート(HTML) 5 Page - Intersil Corporation |
5 / 13 page 5 FN6836.1 May 27, 2009 Test Circuits and Waveforms Logic input waveform is inverted for switches that have the opposite logic sense. FIGURE 1A. MEASUREMENT POINTS Repeat test for all switches. CL includes fixture and stray capacitance. FIGURE 1B. TEST CIRCUIT FIGURE 1. SWITCHING TIMES FIGURE 2A. MEASUREMENT POINTS Repeat test for all switches. CL includes fixture and stray capacitance. FIGURE 2B. TEST CIRCUIT FIGURE 2. BREAK-BEFORE-MAKE TIME FIGURE 3. rON TEST CIRCUIT 50% tr < 20ns tf < 20ns tOFF 90% VDD 0V VINPUT 0V tON LOGIC INPUT SWITCH INPUT SWITCH OUTPUT 90% VOUT V OUT V (INPUT) R L R L r ON + ------------------------ = SWITCH INPUT VIN VOUT RL CL Dx HSDxx SEL GND VDD C OE VINPUT 90% VDD 0V tD LOGIC INPUT SWITCH OUTPUT 0V VOUT VIN SEL Dx RL CL VOUT HSD2x VDD GND VINPUT C OE HSD1x VDD C 0V OR VDD HSDx Dx SEL GND VHSDX V1 rON = V1/40mA 40mA Repeat test for all switches. OE ISL54223 |
同様の部品番号 - ISL54223_09 |
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同様の説明 - ISL54223_09 |
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