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ADE8052Z-DWDL1 データシート(Datasheet) 9 Page - Analog Devices

部品番号. ADE8052Z-DWDL1
部品情報  Single-Phase Energy Measurement IC with 8052 MCU, RTC, and LCD Driver
ダウンロード  156 Pages
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メーカー  AD [Analog Devices]
ホームページ  http://www.analog.com
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 9 page
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ADE5166/ADE5169/ADE5566/ADE5569
Rev. B | Page 9 of 156
Parameter
Min
Typ
Max
Unit
Test Conditions/Comments
POWER SUPPLY INPUTS
VDD
3.13
3.3
3.46
V
VBAT
2.4
3.3
3.7
V
INTERNAL POWER SUPPLY SWITCH (VSWOUT)
VBAT to VSWOUT On Resistance
12
Ω
VBAT = 2.4 V
VDD to VSWOUT On Resistance
9
Ω
VDD = 3.13 V
VBAT to/from VDD Switching Open Time
40
ns
BCTRL State Change and Switch Delay
18
μs
VSWOUT Output Current Drive
6
mA
POWER SUPPLY OUTPUTS
VINTA
2.3
2.70
V
VINTD
2.3
2.70
V
VINTA Power Supply Rejection
60
dB
VINTD Power Supply Rejection
50
dB
POWER SUPPLY CURRENTS
Current in Normal Mode (PSM0)
4.4
5.3
mA
fCORE = 4.096 MHz, LCD and meter active
2.2
mA
fCORE = 1.024 MHz, LCD and meter active
1.6
mA
fCORE = 32.768 kHz, LCD and meter active
3
3.9
mA
fCORE = 4.096 MHz; metering ADC and DSP,
powered down
Current in Battery Mode (PSM1)
3.3
5.05
mA
fCORE = 4.096 MHz, LCD active, VBAT = 3.7 V
1
mA
fCORE = 1.024 MHz, LCD active
Current in Sleep Mode (PSM2)
38
μA
LCD active with charge pump at 3.3 V + RTC,
VBAT = 3.3 V
1.7
μA
RTC only, TA = 25°C, VBAT = 3.3 V
1 Specifications guaranteed by design.
2 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
3 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Standard 22 Method A117. Retention lifetime derates with junction temperature.
4 Recommended crystal specifications.
5 Test carried out with all the I/Os set to a low output level.
6 Delay between power supply valid and execution of first instruction by 8052 core.




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