データシートサーチシステム |
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TS120GSSD25D-M データシート(PDF) 7 Page - Transcend Information. Inc. |
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TS120GSSD25D-M データシート(HTML) 7 Page - Transcend Information. Inc. |
7 / 18 page T T TS S S6 6 60 0 0G G GS S SS S SD D D2 2 25 5 5D D D---M M M T T TS S S1 1 12 2 20 0 0G G GS S SS S SD D D2 2 25 5 5D D D---M M M 2.5” Solid State Drive Transcend Information Inc. Preliminary V1.02 7 Reliability Reliability Reliability Reliability Wear-Leveling algorithm The controller supports static/dynamic wear leveling. When the host writes data, the controller will find and use the block with the lowest erase count among the free blocks. This is known as dynamic wear leveling. When the free blocks' erase count is higher than the data blocks', it will activate the static wear leveling, replacing the not so frequently used user blocks with the high erase count free blocks. ECC algorithm The controller use Reed Solomon code or BCH code option Reed Solomon: 6Bytes/sector for 128Bytes spare and 12Bytes/sector for 218Bytes spare BCH: 8 or 12 bits/sector for 128Bytes spare and 16bits/sector for 218Bytes spare size Bad-block management When the flash encounters ECC failed, program fail or erase fail, the controller will mark the block as bad block to prevent the used of this block and caused data lost later on. |
同様の部品番号 - TS120GSSD25D-M |
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同様の説明 - TS120GSSD25D-M |
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