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HCPL-2630 データシート(PDF) 4 Page - QT Optoelectronics |
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HCPL-2630 データシート(HTML) 4 Page - QT Optoelectronics |
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4 / 10 page  Characteristics Test Conditions Symbol Min Typ** Max Unit Input-Output (Relative humidity = 45%) Insulation Leakage Current (TA = 25°C, t = 5 s) II-O 1.0* µA (VI-O = 3000 VDC) (Note 12) Withstand Insulation Test Voltage (RH < 50%, TA = 25°C) VISO 2500 VRMS (Note 12) ( t = 1 min.) Resistance (Input to Output) (VI-O = 500 V) (Note 12) RI-O 1012 ! Capacitance (Input to Output) (f = 1 MHz) (Note 12) CI-O 0.6 pF ISOLATION CHARACTERISTICS (T A = -40°C to +85°C Unless otherwise specified.) ** All typical values are at VCC = 5 V, TA = 25°C 1. The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins of each device. 2. Each channel. 3. Enable Input - No pull up resistor required as the device has an internal pull up resistor. 4. tPLH - Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5 V level on the LOW to HIGH transition of the output voltage pulse. 5. tPHL - Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse. 6. tr - Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse. 7. tf - Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse. 8. tELH - Enable input propagation delay is measured from the 1.5 V level on the HIGH to LOW transition of the input voltage pulse to the 1.5 V level on the LOW to HIGH transition of the output voltage pulse. 9. tEHL - Enable input propagation delay is measured from the 1.5 V level on the LOW to HIGH transition of the input voltage pulse to the 1.5 V level on the HIGH to LOW transition of the output voltage pulse. 10. CMH - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT > 2.0 V). Measured in volts per microsecond (V/µs). 11. CML - The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the low output state (i.e., VOUT < 0.8 V). Measured in volts per microsecond (V/µs). 12. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together. NOTES DC Characteristics Test Conditions Symbol Min Typ** Max Unit High Level Output Current (VCC = 5.5 V, VO = 5.5 V) IOH 100 µA (IF = 250 µA, VE = 2.0 V) (Note 2) Low Level Output Current (VCC = 5.5 V, IF = 5 mA) VOL .35 .06 V (VE = 2.0 V, ICL = 13 mA) (Note 2) Input Threshold Current (VCC = 5.5 V, VO = 0.6 V, IFT 35 mA VE = 2.0 V, IOL = 13 mA) TRANSFER CHARACTERISTICS (T A = -40°C to +85°C Unless otherwise specified.) SINGLE-CHANNEL DUAL-CHANNEL 6N137 HCPL-2630 HCPL-2601 HCPL-2631 HCPL-2611 HIGH SPEED-10 MBit/s LOGIC GATE OPTOCOUPLERS 8/10/99 200002A |
同様の部品番号 - HCPL-2630 |
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同様の説明 - HCPL-2630 |
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