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CAT130089TWI-GT3 データシート(PDF) 2 Page - ON Semiconductor |
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CAT130089TWI-GT3 データシート(HTML) 2 Page - ON Semiconductor |
2 / 14 page CAT130xx Doc. No. MD-1121 Rev. B 2 © 2008 SCILLC. All rights reserved. Characteristics subject to change without notice BLOCK DIAGRAM ABSOLUTE MAXIMUM RATINGS (1) Parameters Ratings Units Storage Temperature -65 to +150 °C Voltage on Any Pin with Respect to Ground (2) -0.5 to +6.5 V RELIABILITY CHARACTERISTICS (3) Symbol Parameter Min Units NEND (4) Endurance 1,000,000 Program/ Erase Cycles TDR Data Retention 100 Years D.C. OPERATING CHARACTERISTICS VCC = +2.5V to +5.5V unless otherwise specified. Limits Symbol Parameter Min. Typ. Max. Test Condition Units ICC Supply Current 3 Read or Write at 1MHz mA 12 25 VCC < 5.5V; All I/O Pins at VSS or VCC ISB Standby Current 10 20 VCC < 3.6V; All I/O Pins at VSS or VCC μA IL I/O Pin Leakage 2 Pin at GND or VCC μA VIL Input Low Voltage -0.5 0.8 V VIH Input High Voltage 2.0 VCC + 0.5 V VOL Output Low Voltage 0.4 VCC ≥ 2.5V, IOL = 2.1mA V VOH Output High Voltage 2.4 VCC ≥ 4.5V, IOH = -0.4mA V Notes: (1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. (2) The DC input voltage on any pin should not be lower than -0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may undershoot to no less than -1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns. (3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and JEDEC test methods. (4) Block Mode, VCC = 5 V, 25°C DO EEPROM ORG CS SK DI VCC VOLTAGE DETECTOR RST or RST VSS |
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同様の説明 - CAT130089TWI-GT3 |
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