CDCM61004

www.ti.com

SCAS871E – FEBRUARY 2009 – REVISED JULY 2010

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGED DEVICES

CDCM61004RHBT

32-pin QFN (RHB) package, small tape and reel

–40°C to +85°C

CDCM61004RHBR

32-pin QFN (RHB) package, tape and reel

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at ti.com.

(2)

These packages conform to Lead (Pb)-free and green manufacturing specifications. Additional details including specific material

contentcan be accessed at www.ti.com/leadfree. GREEN: TI defines Green to mean Lead (Pb)-Free and in addition, uses less package

materials that do not contain halogens, including bromine (Br), or antimony (Sb) above 0.1%of total product weight. N/A: Not yet

available Lead (Pb)-Free; for estimated conversion dates, go to www.ti.com/leadfree. Pb-FREE: TI defines Lead (Pb)-Free to mean

RoHS compatible, including a lead concentration that does not exceed 0.1% of total product weight, and, if designed to be soldered,

suitable for use in specified lead-free soldering processes.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

PARAMETER

VALUE

UNIT

–0.5 to 4.6

V

VIN

V

VOUT

V

IIN

Input current

20

mA

IOUT

Output current

50

mA

Storage temperature range

–65 to +150

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

condition is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All supply voltages must be supplied simultaneously.

(3)

Input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

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Product Folder Link(s): CDCM61004