データシートサーチシステム |
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LMH6629SDE データシート(PDF) 6 Page - National Semiconductor (TI) |
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LMH6629SDE データシート(HTML) 6 Page - National Semiconductor (TI) |
6 / 22 page Symbol Parameter Conditions Min (Note 5) Typ (Note 5) Max (Note 5) Units I BI Input Bias Current (Note 6) −15 −23 −35 μA I OS Input Offset Current ±0.13 ±1.8 ±3.0 μA T CIOS Input offset voltage temperature drift (Note 7) ±3.2 nA/°C C CM Input Capacitance Common Mode 1.7 pF R CM Input Resistance Common Mode 1 M Ω MISCELLANEOUS PARAMETERS CMRR Common Mode Rejection Ratio V CM from 0V to 2.0V 84 81 87 dB PSRR Power supply rejection ratio 82 79 84 A VOL Open Loop Gain 78 73 79 DIGITAL INPUTS/TIMING V IL Logic low-voltage threshold PD and COMP pins 0.8 V V IH Logic high-voltage threshold 2.0 I IL Logic low-bias current PD and COMP pins = 0.8V (Note 6) -17 −14 −23 −28 −32 µA I IH Logic high-bias current PD and COMP pins = 2.0V (Note 6) −16 −13 −22 −27 −31 T en Enable time 75 ns T dis Disable time 80 POWER REQUIREMENTS I S Supply Current No Load, Normal Operation (PD Pin = HI or open) 13.7 14.9 16.0 mA No Load, Shutdown (PD Pin = LO) 0.89 1.4 1.5 Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics. Note 2: Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that T J = TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > T A. Note 3: The maximum continuous output current (I OUT) is determined by device power dissipation limitations. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature of 150°C Note 4: Human Body Model, applicable std. JESD22-A114C. Machine Model, applicable std. JESD22-A115-A. Field Induced Charge Device Model, applicable std. JESD22-C101-C. Note 5: Typical numbers are the most likely parametric norm. Bold numbers refer to over-temperature limits. Note 6: Negative input current implies current flowing out of the device. Note 7: Drift determined by dividing the change in parameter at temperature extremes by the total temperature change. www.national.com 6 |
同様の部品番号 - LMH6629SDE |
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同様の説明 - LMH6629SDE |
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