データシートサーチシステム |
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TS12A4517DR データシート(PDF) 8 Page - Texas Instruments |
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TS12A4517DR データシート(HTML) 8 Page - Texas Instruments |
8 / 15 page 50% tOFF tON VIN 0 V IN NO COM 50 Ω TS12A4516 300 Ω 35 pF 90% 90% 0 V 50% tON tOFF VIN 0 V IN NC COM 50 Ω 300 Ω 35 pF 90% 90% 0 V TS12A4517 VNOPEAK VNOPEAK VNO VOUT VIN VNO VOUT VIN V+ V+ V+ V+ V+ V+ VOUT VOUT V– V– Measurements are standardized against short at socket terminals. OFF isolation is measured between COM and OFF terminals on each switch. ON loss is measured between COM and ON terminals on each switch. Signal direction through switch is reversed; worst values are recorded. VOUT IN NO COM VIN TS12A4516 OFF Isolation = 20log VOUT VIN ON Loss = 20log VOUT VIN 50 Ω 50 Ω 50 Ω 50 Ω MEAS REF 10 nF TS12A4517 V+ V+ V+ V– or NC IN NO COM TS12A4516 1-MHz As Required Analyzer Capacitance or NC TS12A4517 V+ V+ V– TS12A4516 ,, TS12A4517 SCDS236B – DECEMBER 2006 – REVISED APRIL 2009 ................................................................................................................................................. www.ti.com Figure 2. Switching Times Figure 3. OFF Isolation and ON Loss Figure 4. NO, NC, and COM Capacitance 8 Submit Documentation Feedback Copyright © 2006–2009, Texas Instruments Incorporated Product Folder Link(s): TS12A4516 TS12A4517 |
同様の部品番号 - TS12A4517DR |
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同様の説明 - TS12A4517DR |
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