データシートサーチシステム |
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ISL54227IRTZ データシート(PDF) 8 Page - Intersil Corporation |
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ISL54227IRTZ データシート(HTML) 8 Page - Intersil Corporation |
8 / 18 page ISL54227 8 FN7593.0 July 2, 2010 Application Block Diagram FIGURE 5A. MEASUREMENT POINTS FIGURE 5B. TEST CIRCUIT FIGURE 5. SKEW TEST Test Circuits and Waveforms (Continued) DIN+ DIN- OUT+ OUT- 50% 50% 90% 10% 10% 10% 10% 90% 90% 50% 90% 50% tri tfi tro tf0 tskew_i tskew_o OUT+ CL COM+ D- GND VDD C D+ COM- CL OUT- DIN+ DIN- |tro - tri| Delay Due to Switch for Rising Input and Rising Output Signals. |tfo - tfi| Delay Due to Switch for Falling Input and Falling Output Signals. |tskew_0| Change in Skew through the Switch for Output Signals. |tskew_i| Change in Skew through the Switch for Input Signals. 15.8 Ω 15.8 Ω 143 Ω 143 Ω 45 Ω 45 Ω VDD OE PORTABLE MEDIA DEVICE ISL54227 USB TRANSCEIVER HIGH-SPEED COM- COM+ INT GND D+ D- VDD OE µCONTROLLER VBUS D- D+ GND OR FULL-SPEED OVP DET 4MΩ >1MΩ 3.6V ALM LP LOGIC 4MΩ 500Ω 3.3V CONTROL |
同様の部品番号 - ISL54227IRTZ |
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同様の説明 - ISL54227IRTZ |
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