Si824x

Rev. 0.2

9

Table 4. Insulation and Safety-Related Specifications

Parameter

Symbol

Test Condition

Value

Unit

NBSOIC-16

Nominal Air Gap

(Clearance)1

L(1O1)

4.01

mm

Nominal External Tracking (Creepage)1

L(1O2)

4.01

mm

Minimum Internal Gap

(Internal Clearance)

0.011

mm

Tracking Resistance

(Proof Tracking Index)

PTI

IEC60112

600

V

Erosion Depth

ED

0.019

mm

Resistance

(Input-Output)2



Capacitance

(Input-Output)2

f=1MHz

1.4

pF

Input Capacitance3

4.0

pF

Notes:

1. The values in this table correspond to the nominal creepage and clearance values as detailed in “7. Package Outline:

16-Pin Narrow Body SOIC” . VDE certifies the clearance and creepage limits as 4.7 mm minimum for the NB SOIC-16.

UL does not impose a clearance and creepage minimum for component level certifications. CSA certifies the clearance

and creepage limits as 3.9 mm minimum for the NB SOIC 16.

2. To determine resistance and capacitance, the Si824x is converted into a 2-terminal device. Pins 1–8 are shorted

together to form the first terminal and pins 9–16 are shorted together to form the second terminal. The parameters are

then measured between these two terminals.

3. Measured from input pin to ground.

Table 5. IEC 60664-1 (VDE 0884 Part 2) Ratings

Parameter

Test Conditions

Specification

NB SOIC-16

Basic Isolation Group

Material Group

I

Installation Classification

I-IV

I-III

I-II

I-II