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データシートサーチシステム |
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データシートサーチシステム |
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IRFD020 データシート(PDF) 7 Page - Vishay Siliconix |
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IRFD020 データシート(HTML) 7 Page - Vishay Siliconix |
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7 / 8 page  Document Number: 91465 www.vishay.com S11-0915-Rev. A, 16-May-11 7 This document is subject to change without notice. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 IRFD020, SiHFD020 Vishay Siliconix Fig. 18 - Typical Time to Accumulated 1 % Gate Failure Fig. 19 - Typical High Temperature Reverse Bias (HTRB) Failure Rate Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see www.vishay.com/ppg?91465. |
同様の部品番号 - IRFD020 |
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同様の説明 - IRFD020 |
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