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74HC4051PW データシート(PDF) 21 Page - NXP Semiconductors |
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74HC4051PW データシート(HTML) 21 Page - NXP Semiconductors |
21 / 31 page 74HC_HCT4051 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 6 — 13 December 2011 21 of 31 NXP Semiconductors 74HC4051; 74HCT4051 8-channel analog multiplexer/demultiplexer Fig 16. Test circuit for measuring sine-wave distortion dB 001aan385 Yn/Z 10 μF Vis Vos Z/Yn CL RL Sn GND VEE VCC VCC = 4.5 V; GND = 0 V; VEE = 4.5 V; RL = 600 ; RS =1k. a. Test circuit b. Isolation (OFF-state) as a function of frequency Fig 17. Test circuit for measuring isolation (OFF-state) dB 001aan386 Yn/Z 0.1 μF Vis Vos Z/Yn CL RL Sn GND VEE VCC 001aae332 fi (kHz) 10 105 106 104 102 103 −60 −40 −80 −20 0 αiso (dB) −100 |
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