データシートサーチシステム |
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DAC5662A データシート(PDF) 2 Page - Texas Instruments |
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DAC5662A データシート(HTML) 2 Page - Texas Instruments |
2 / 26 page DE MUX DA[11:0] DB[11:0] MODE GSET Latch A Latch B 12−b DAC 12−b DAC IOUTA1 IOUTA2 IOUTB1 IOUTB2 1.2 V Reference WRTB WRTA CLKB CLKA BIASJ_A BIASJ_B EXTIO DVDD DGND AVDD AGND SLEEP DAC5662A SLAS536B – SEPTEMBER 2007 – REVISED DECEMBER 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FUNCTIONAL BLOCK DIAGRAM AVAILABLE OPTIONS PACKAGED DEVICES TA 48-TQFP DAC5662AIPFB -40°C to 85°C DAC5662AIPFBR 2 Submit Documentation Feedback Copyright © 2007–2010, Texas Instruments Incorporated Product Folder Link(s): DAC5662A |
同様の部品番号 - DAC5662A |
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同様の説明 - DAC5662A |
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