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DAC7551TDRNRQ1 データシート(PDF) 3 Page - Texas Instruments |
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DAC7551TDRNRQ1 データシート(HTML) 3 Page - Texas Instruments |
3 / 22 page DAC7551-Q1 www.ti.com SLAS767 – JUNE 2011 ELECTRICAL CHARACTERISTICS all specifications at –40°C to +105°C, VDD = 2.7V to 5.5V, VREFH = VDD, VREFL = GND, RL = 2kΩ to GND, and CL = 200pF to GND (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNITS STATIC PERFORMANCE(1) Resolution 12 Bits Relative accuracy ±0.35 ±1 LSB Differential nonlinearity Specified monotonic by design ±0.08 ±0.5 LSB Offset error ±12 mV Zero-scale error All zeroes loaded to DAC register ±12 mV Gain error ±0.15 %FSR Full-scale error ±0.5 %FSR Zero-scale error drift 7 μV/°C ppm of Gain temperature coefficient 3 FSR/ °C PSRR VDD = 5V 0.75 mV/V OUTPUT CHARACTERISTICS(2) Output voltage range 2 x VREFL VREFH V Output voltage settling time RL = 2kΩ, 0pF < CL < 200pF 5 μs Slew rate 1.8 V/ μs RL = ∞ 470 Capacitive load stability pF RL = 2kΩ 1000 Digital-to-analog glitch impulse 1 LSB change around major carry 0.1 nV-s Digital feedthrough 0.1 nV-s Output noise density 10kHz offset frequency 120 nV/ √Hz Total harmonic distortion fOUT = 1kHz, fS = 1MSPS, BW = 20kHz –85 dB DC output impedance 1 Ω VDD = 5V 50 Short-circuit current mA VDD = 3V 20 Coming out of power-down mode, VDD = 5V 15 Power-up time μs Coming out of power-down mode, VDD = 3V 15 REFERENCE INPUT VREFH Input range 0 VDD V VREFL Input range VREFL < VREFH 0 GND VDD V Reference input impedance 100 k Ω VREF = VDD = 5V 50 100 Reference current μA VREF = VDD = 3V 30 60 LOGIC INPUTS(2) Input current ±1 μA VIN_L, Input low voltage IOVDD ≥ 2.7V 0.3 IOVDD V VIN_H, Input high voltage IOVDD ≥ 2.7V 0.7 IOVDD V Pin capacitance 3 pF (1) Linearity tested using a reduced code range of 30 to 4065; output unloaded. (2) Specified by design and characterization; not production tested. For 1.8V < IOVDD < 2.7V, it is recommended that VIH ≥ 0.8 IOVDD, and VIL ≤ 0.2 IOVDD. Copyright © 2011, Texas Instruments Incorporated 3 |
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