TMP303A

TMP303B

SBOS486B – JULY 2009 – REVISED JANUARY 2011

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

PACKAGE

PACKAGE DESIGNATOR

PACKAGE MARKING

TMP303A

OCO

SOT563

DRL

TMP303B

QWM

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

TMP303A, TMP303B

UNIT

+3.6

V

Input Pins, Voltage

V

Output Pin, Voltage

OUT

V

Output Pin, Current

OUT

8

mA

Operating Temperature Range

–55 to +130

°C

Storage Temperature Range

–60 to +150

°C

+150

°C

Human Body Model (HBM)

2000

V

ESD Rating

Charged Device Model (CDM)

1000

V

Machine Model (MM)

200

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

2

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Product Folder Link(s): TMP303A TMP303B