1

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16

PW PACKAGE

(TOP VIEW)

IN1

IN2

A0

A1

SCL

SDA

PENIRQ

V

REF

V

DD

X+

Y+

X–

Y–

GND

V

BAT1

V

BAT2

TSC2003-Q1

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERABLE PART NUMBER

TOP-SIDE MARKING

–40°C to 85°C

TSSOP – PW

Reel of 2000

TSC2003IPWRQ1

T2003Q1

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

TERMINAL FUNCTIONS

TERMINAL

I/O

DESCRIPTION

NAME

NO.

1

Power supply

X+

2

I

X+ position

Y+

3

I

Y+ position

X–

4

I

X– position

Y–

5

I

Y– position

GND

6

Ground

7

I

Battery monitor 1

8

I

Battery monitor 1

9

I/O

Voltage reference

PENIRQ

10

O

Pen interrupt. Open-drain, requires 30-k

Ω to 100-kΩ external pullup resistor.

SDA

11

I/O

Serial data

SCL

12

I

Serial clock

A1

13

I

A0

14

I

IN2

15

I

Auxiliary analog-to-digital converter input 2

IN1

16

I

Auxiliary analog-to-digital converter input 1

2

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Product Folder Link(s): TSC2003-Q1