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OP27AJ データシート(PDF) 2 Page - Analog Devices |
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OP27AJ データシート(HTML) 2 Page - Analog Devices |
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2 / 16 page  REV. A –2– OP27 ELECTRICAL CHARACTERISTICS OP27A/E OP27F OP27C/G Parameter Symbol Conditions Min Typ Max Min Typ Max Min Typ Max Unit INPUT OFFSET VOLTAGE 1 VOS 10 25 20 60 30 100 µV LONG-TERM VOS STABILITY 2, 3 VOS/Time 0.2 1.0 0.3 1.5 0.4 2.0 µV/MO INPUT OFFSET CURRENT IOS 7 35 9 50 12 75 nA INPUT BIAS CURRENT IB ±10 ±40 ±12 ±55 ±15 ±80 nA INPUT NOISE VOLTAGE 3, 4 en p-p 0.1 Hz to 10 Hz 0.08 0.18 0.08 0.18 0.09 0.25 µV p-p INPUT NOISE en fO = 10 Hz 3.5 5.5 3.5 5.5 3.8 8.0 nV/ √Hz Voltage Density3 fO = 30 Hz 3.1 4.5 3.1 4.5 3.3 5.6 nV/ √Hz fO = 1000 Hz 3.0 3.8 3.0 3.8 3.2 4.5 nV/ √Hz INPUT NOISE in fO = 10 Hz 1.7 4.0 1.7 4.0 1.7 pA/ √Hz Current Density 3, 5 fO = 30 Hz 1.0 2.3 1.0 2.3 1.0 pA/ √Hz fO = 1000 Hz 0.4 0.6 0.4 0.6 0.4 0.6 pA/ √Hz INPUT RESISTANCE Differential-Mode 6 RIN 1.3 6 0.94 5 0.7 4 M Ω Common-Mode RINCM 3 2.5 2 G Ω INPUT VOLTAGE RANGE IVR ±11.0 ±12.3 ±11.0 ±12.3 ±11.0 ±12.3 V COMMON-MODE REJECTION RATIO CMRR VCM = ±11 V 114 126 106 123 100 120 dB POWER SUPPLY PSRR VS = ±4 V REJECTION RATIO to ±18 V 1 10 1 10 2 20 µV/V LARGE-SIGNAL AVO RL ≥ 2 kΩ, VOLTAGE GAIN VO = ±10 V 1000 1800 1000 1800 700 1500 V/mV RL ≥ 600 Ω, VO = ±10 V 800 1500 800 1500 600 1500 V/mV OUTPUT VOLTAGE SWING VO RL ≥ 2 kΩ±12.0 ±13.8 ±12.0 ±13.8 ±11.5 ±13.5 V RL ≥ 600 Ω±10.0 ±11.5 ±10.0 ±11.5 ±10.0 ±11.5 V SLEW RATE 7 SR RL ≥ 2 kΩ 1.7 2.8 1.7 2.8 1.7 2.8 V/ µs GAIN BANDWIDTH PRODUCT 7 GBW 5.0 8.0 5.0 8.0 5.0 8.0 MHz OPEN-LOOP OUTPUT RESISTANCE RO VO = 0, IO = 0 7070 70 Ω POWER CONSUMPTION Pd VO 90 140 90 140 100 170 mW OFFSET ADJUSTMENT RANGE RP = 10 k Ω±4.0 ±4.0 ±4.0 mV NOTES 1Input offset voltage measurements are performed ~ 0.5 seconds after application of power. A/E grades guaranteed fully warmed up. 2Long-term input offset voltage stability refers to the average trend line of V OS versus. Time over extended periods after the first 30 days of operation. Excluding the initial hour of operation, changes in VOS during the first 30 days are typically 2.5 µV. Refer to typical performance curve. 3Sample tested. 4See test circuit and frequency response curve for 0.1 Hz to 10 Hz tester. 5See test circuit for current noise measurement. 6Guaranteed by input bias current. 7Guaranteed by design. (@ VS = ±15 V, TA = 25 C, unless otherwise noted.) –SPECIFICATIONS |
同様の部品番号 - OP27AJ |
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同様の説明 - OP27AJ |
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