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ADF4117BCP データシート(PDF) 3 Page - Analog Devices |
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ADF4117BCP データシート(HTML) 3 Page - Analog Devices |
3 / 20 page –3– REV. 0 ADF4116/ADF4117/ADF4118 Parameter B Version B Chips 2 Unit Test Conditions/Comments NOISE CHARACTERISTICS ADF4118 Phase Noise Floor 7 –170 –170 dBc/Hz typ @ 25 kHz PFD Frequency –162 –162 dBc/Hz typ @ 200 kHz PFD Frequency Phase Noise Performance 8 @ VCO Output ADF4116 9 540 MHz Output –89 –89 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency ADF411710 900 MHz Output –87 –87 dBc/Hz typ Note 15 ADF4118 10 900 MHz Output –90 –90 dBc/Hz typ Note 15 ADF4117 11 836 MHz Output –78 –78 dBc/Hz typ @ 300 Hz Offset and 30 kHz PFD Frequency ADF411812 1750 MHz Output –85 –85 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency ADF4118 13 1750 MHz Output –65 –65 dBc/Hz typ @ 200 Hz Offset and 10 kHz PFD Frequency ADF4118 14 1960 MHz Output –84 –84 dBc/Hz typ @ 1 kHz Offset and 200 kHz PFD Frequency Spurious Signals ADF4116 9 540 MHz Output –88/–99 –88/–99 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency ADF4117 10 900 MHz Output –90/–104 –90/–104 dBc typ Note 15 ADF4118 10 900 MHz Output –91/–100 –91/–100 dBc typ Note 15 ADF4117 11 836 MHz Output –80/–84 –80/–84 dBc typ @ 30 kHz/60 kHz and 30 kHz PFD Frequency ADF4118 12 1750 MHz Output –88/–90 –88/–90 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency ADF4118 13 1750 MHz Output –65/–73 –65/–73 dBc typ @ 10 kHz/20 kHz and 10 kHz PFD Frequency ADF4118 14 1960 MHz Output –80/–86 –80/–86 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD Frequency NOTES 1Operating temperature range is as follows: B Version: –40 °C to +85°C. 2The B Chip specifications are given as typical values. 3This is the maximum operating frequency of the CMOS counters. 4AV DD = DVDD = 3 V; for AVDD = DVDD = 5 V, use CMOS-compatible levels. 5Guaranteed by design. Sample tested to ensure compliance. 6AV DD = DVDD = 3 V; RFIN for ADF4116 = 540 MHz; RFIN for ADF4117, ADF4118 = 900 MHz. 7The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20 log N (where N is the N divider value). 8The phase noise is measured with the EVAL-ADF411xEB Evaluation Board and the HP8562E Spectrum Analyzer. The spectrum analyzer provides the REFIN for the synthesizer (fREFOUT = 10 MHz @ 0 dBm). 9f REFIN = 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; f RF = 540 MHz; N = 2700; Loop B/W = 20 kHz. 10f REFIN = 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fRF = 900 MHz; N = 4500; Loop B/W = 20 kHz. 11f REFIN = 10 MHz; fPFD = 30 kHz; Offset frequency = 300 Hz; fRF = 836 MHz; N = 27867; Loop B/W = 3 kHz. 12f REFIN = 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fRF = 1750 MHz; N = 8750; Loop B/W = 20 kHz. 13f REFIN = 10 MHz; fPFD = 10 kHz; Offset frequency = 200 Hz; fRF = 1750 MHz; N = 175000; Loop B/W = 1 kHz. 14f REFIN = 10 MHz; fPFD = 200 kHz; Offset frequency = 1 kHz; fRF = 1960 MHz; N = 9800; Loop B/W = 20 kHz. 15Same conditions as above. Specifications subject to change without notice. TIMING CHARACTERISTICS 1 Limit at TMIN to TMAX Parameter (B Version) Unit Test Conditions/Comments t1 10 ns min DATA to CLOCK Setup Time t2 10 ns min DATA to CLOCK Hold Time t3 25 ns min CLOCK High Duration t4 25 ns min CLOCK Low Duration t5 10 ns min CLOCK to LE Setup Time t6 20 ns min LE Pulsewidth NOTE 1Guaranteed by design but not production tested. Specifications subject to change without notice. (AVDD = DVDD = 3 V 10%, 5 V 10%; AVDD ≤ VP < 6.0 V; AGND = DGND = CPGND = 0 V; TA = TMIN to TMAX unless otherwise noted) |
同様の部品番号 - ADF4117BCP |
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同様の説明 - ADF4117BCP |
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