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TPD4E05U06DQAR データシート(PDF) 4 Page - Texas Instruments |
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TPD4E05U06DQAR データシート(HTML) 4 Page - Texas Instruments |
4 / 15 page TPD1E05U06 TPD4E05U06 TPD6E05U06 SLVSBO7B – DECEMBER 2012 – REVISED JANUARY 2013 www.ti.com QUAD CHANNEL TERMINAL FUNCTIONS TERMINAL TYPE DESCRIPTION USAGE NAME PIN NO. D1+ 1 I/O ESD protected channel Connect it as close to the connector as possible D1– 2 I/O ESD protected channel Connect it as close to the connector as possible D2+ 4 I/O ESD protected channel Connect it as close to the connector as possible D2– 5 I/O ESD protected channel Connect it as close to the connector as possible Used for optional straight-through routing from D+; NC 6, 7, 9, 10 NC No connect otherwise can be left floating or grounded GND 3, 8 GND Ground Connect to ground QUAD CHANNEL TERMINAL FUNCTIONS TERMINAL TYPE DESCRIPTION USAGE NAME PIN NO. D1+ 14 I/O ESD protected channel Connect it as close to the connector as possible D1– 13 I/O ESD protected channel Connect it as close to the connector as possible D2+ 12 I/O ESD protected channel Connect it as close to the connector as possible D2– 12 I/O ESD protected channel Connect it as close to the connector as possible D3+ 9 D3– 8 1, 2, 3, 4, 6, Used for optional straight-through routing from D+; NC NC No connect 7 otherwise can be left floating or grounded GND 5, 10 GND Ground Connect to ground ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) PARAMETER MIN MAX UNIT TA Operating free-air temperature range –40 125 °C Tstg Storage temperature range –65 155 °C IEC 61000-4-2 Contact Discharge ±12 kV ESD protection IEC 61000-4-2 Air-Gap Discharge ±15 kV IPP Peak pulse current (tp = 8/20 μs) 2.5 A PPP Peak pulse power (tp = 8/20 μs) 40 W (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum-rated conditions for extended periods may affect device reliability. 4 Submit Documentation Feedback Copyright © 2012–2013, Texas Instruments Incorporated Product Folder Links: TPD1E05U06 TPD4E05U06 TPD6E05U06 |
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