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LM2674LD-ADJ データシート(PDF) 4 Page - Texas Instruments |
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LM2674LD-ADJ データシート(HTML) 4 Page - Texas Instruments |
4 / 32 page LM2674 SNVS007F – SEPTEMBER 1998 – REVISED APRIL 2013 www.ti.com LM2674-5.0 Symbol Parameter Conditions Typical(1) Min(2) Max(2) Units SYSTEM PARAMETERSTest Circuit Figure 22(3) VOUT Output Voltage VIN = 8V to 40V, ILOAD = 20 mA to 500 mA 5.0 4.925/4.850 5.075/5.150 V VOUT Output Voltage VIN = 6.5V to 40V, ILOAD = 20 mA to 250 mA 5.0 4.925/4.850 5.075/5.150 V η Efficiency VIN = 12V, ILOAD = 500 mA 90 % (1) Typical numbers are at 25°C and represent the most likely norm. (2) All limits ensured at room temperature (standard type face) and at temperature extremes (bold type face). All room temperature limits are 100% production tested. All limits at temperature extremes are ensured via correlation using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL). (3) External components such as the catch diode, inductor, input and output capacitors, and voltage programming resistors can affect switching regulator performance. When the LM2674 is used as shown in Figure 22 andFigure 23 test circuits, system performance will be as specified by the system parameters section of the Electrical Characteristics. LM2674-12 Symbol Parameter Conditions Typical(1) Min(2) Max(2) Units SYSTEM PARAMETERSTest Circuit Figure 22(3) VOUT Output Voltage VIN = 15V to 40V, ILOAD = 20 mA to 500 mA 12 11.82/11.64 12.18/12.36 V η Efficiency VIN = 24V, ILOAD = 500 mA 94 % (1) Typical numbers are at 25°C and represent the most likely norm. (2) All limits ensured at room temperature (standard type face) and at temperature extremes (bold type face). All room temperature limits are 100% production tested. All limits at temperature extremes are ensured via correlation using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL). (3) External components such as the catch diode, inductor, input and output capacitors, and voltage programming resistors can affect switching regulator performance. When the LM2674 is used as shown in Figure 22 andFigure 23 test circuits, system performance will be as specified by the system parameters section of the Electrical Characteristics. LM2674-ADJ Symbol Parameter Conditions Typ(1) Min(2) Max(2) Units SYSTEM PARAMETERS Test Circuit Figure 23(3) VFB Feedback Voltage VIN = 8V to 40V, ILOAD = 20 mA to 500 mA VOUT Programmed for 5V 1.210 1.192/1.174 1.228/1.246 V (see Circuit of Figure 23) VFB Feedback Voltage VIN = 6.5V to 40V, ILOAD = 20 mA to 250 mA VOUT Programmed for 5V 1.210 1.192/1.174 1.228/1.246 V (see Circuit of Figure 23) η Efficiency VIN = 12V, ILOAD = 500 mA 90 % (1) Typical numbers are at 25°C and represent the most likely norm. (2) All limits ensured at room temperature (standard type face) and at temperature extremes (bold type face). All room temperature limits are 100% production tested. All limits at temperature extremes are ensured via correlation using standard Statistical Quality Control (SQC) methods. All limits are used to calculate Average Outgoing Quality Level (AOQL). (3) External components such as the catch diode, inductor, input and output capacitors, and voltage programming resistors can affect switching regulator performance. When the LM2674 is used as shown in Figure 22 andFigure 23 test circuits, system performance will be as specified by the system parameters section of the Electrical Characteristics. 4 Submit Documentation Feedback Copyright © 1998–2013, Texas Instruments Incorporated Product Folder Links: LM2674 |
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