©2008 Fairchild Semiconductor Corporation
www.fairchildsemi.com
6N13XM, HCPLXXXM Rev. 1.0.6
2
Absolute Maximum Ratings (T
A = 25°C unless otherwise specified)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Notes:
1.
Derate linearly above 70°C free-air temperature at a rate of 0.8mA/°C.
2.
Derate linearly above 70°C free-air temperature at a rate of 1.6mA/°C.
3.
Derate linearly above 70°C free-air temperature at a rate of 0.9 mW/°C.
4.
Derate linearly above 70°C free-air temperature at a rate of 2.0 mW/°C.
Symbol
Parameter
Condition
Value
Units
TSTG
Storage Temperature
-40 to +125
°C
TOPR
Operating Temperature
-40 to +100
°C
TSOL
Lead Solder Temperature
(Wave)
260 for 10 sec
°C
EMITTER
IF (avg)
DC/Average Forward Input
Current Each Channel(1)
25
mA
IF (pk)
Peak Forward Input Current
Each Channel(2)
50% duty cycle, 1ms P.W.
50
mA
IF (trans) Peak Transient Input Current
Each Channel
≤1µs P.W., 300pps
1.0
A
VR
Reverse Input Voltage Each
Channel
5V
PD
Input Power Dissipation Each
Channel(3)
6N135M, 6N136M, HCPL4503M
45
mW
HCPL2530M, HCPL2531M
DETECTOR
IO (avg)
Average Output Current Each
Channel
8
mA
IO (pk)
Peak Output Current Each
Channel
16
mA
VEBR
Emitter-Base Reverse Voltage
6N135M and 6N136M only
5
V
VCC
Supply Voltage
-0.5 to 30
V
VO
Output Voltage
-0.5 to 20
V
IB
Base Current
6N135M and 6N136M only
5
mA
PD
Output Power Dissipation
Each Channel(4)
6N135M, 6N136M, HCPL4503M
100
mW
HCPL2530M, HCPL2531M
35
mW
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