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74HC4052BQ データシート(PDF) 18 Page - NXP Semiconductors |
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74HC4052BQ データシート(HTML) 18 Page - NXP Semiconductors |
18 / 29 page 74HC_HCT4052 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 10 — 19 July 2012 18 of 29 NXP Semiconductors 74HC4052; 74HCT4052 Dual 4-channel analog multiplexer/demultiplexer Fig 16. Test circuit for measuring sine-wave distortion dB 001aah829 nYn/nZ 10 μF Vis Vos nZ/nYn CL RL Sn GND VEE VCC VCC = 4.5 V; GND = 0 V; VEE = 4.5 V; RL = 600 ; RS =1k. a. Test circuit b. Isolation (OFF-state) as a function of frequency Fig 17. Test circuit for measuring isolation (OFF-state) dB 001aah871 nYn/nZ 0.1 μF Vis Vos nZ/nYn CL RL Sn GND VEE VCC 001aae332 fi (kHz) 10 105 106 104 102 103 −60 −40 −80 −20 0 αiso (dB) −100 |
同様の部品番号 - 74HC4052BQ |
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同様の説明 - 74HC4052BQ |
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