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FM25CL64B-GATR データシート(PDF) 11 Page - Cypress Semiconductor |
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FM25CL64B-GATR データシート(HTML) 11 Page - Cypress Semiconductor |
11 / 15 page FM25CL64B - Automotive Temp. Document Number: 001-86149 Rev. *A Page 11 of 15 Serial Data Bus Timing 1/fCK tCL tCH tCSH tODV tOH tOD tCSU tSU tH tD tR tF /Hold Timing Data Retention (VDD = 3.0V to 3.6V unless otherwise specified) Automotive Grade SS Retention Experiment Results OS Retention AEC-Q100 Grade 3 AEC-Q100 Grade 2 AEC-Q100 Grade 1 Unlimited Unlimited Unlimited 10.9 yrs @ 85 OC 5.5 years @ 105 OC 11,200 hours @ 125 OC 10 Years 5 Years 11k Hours Note : Data retention qualification tests are accelerated tests and are performed such that all three conditions have been applied : (1) 10 years at a temperature of +85 C, (2) 5 years at +105 C, and (3) 11,000 hours at +125 C. |
同様の部品番号 - FM25CL64B-GATR |
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同様の説明 - FM25CL64B-GATR |
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