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AD8066ARMZ-REEL7 データシート(PDF) 10 Page - Analog Devices

部品番号 AD8066ARMZ-REEL7
部品情報  High Performance, 145 MHz FastFET Op Amps
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メーカー  AD [Analog Devices]
ホームページ  http://www.analog.com
Logo AD - Analog Devices

AD8066ARMZ-REEL7 データシート(HTML) 10 Page - Analog Devices

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AD8065/AD8066
Rev. J | Page 9 of 28
ABSOLUTE MAXIMUM RATINGS
RMS output voltages should be considered. If RL is referenced to
VS−, as in single-supply operation, then the total drive power is
VS × IOUT.
Table 4.
Parameter
Rating
Supply Voltage
26.4 V
Power Dissipation
See Figure 3
Common-Mode Input Voltage
VEE − 0.5 V to VCC + 0.5 V
Differential Input Voltage
1.8 V
Storage Temperature Range
−65°C to +125°C
Operating Temperature Range
−40°C to +85°C
AD8065WARTZ Only
−40°C to +105°C
Lead Temperature
(Soldering, 10 sec)
300°C
If the rms signal levels are indeterminate, then consider the
worst case, when VOUT = VS/4 for RL to midsupply.
() ()
L
S
S
S
D
R
V
I
V
P
2
4
/
+
×
=
In single-supply operation with RL referenced to VS−, worst case
is VOUT = VS/2.
0
0.5
1.0
1.5
2.0
20
0
–40
–20
–60
40
60
80
100
AMBIENT TEMPERATURE (°C)
MSOP-8
SOIC-8
SOT-23-5
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
MAXIMUM POWER DISSIPATION
The maximum safe power dissipation in the AD8065/AD8066
packages is limited by the associated rise in junction temperature
(TJ) on the die. The plastic encapsulating the die locally reaches
the junction temperature. At approximately 150°C, which is the
glass transition temperature, the plastic changes its properties.
Even temporarily exceeding this temperature limit can change
the stresses that the package exerts on the die, permanently
shifting the parametric performance of the AD8065/AD8066.
Exceeding a junction temperature of 175°C for an extended
time can result in changes in the silicon devices, potentially
causing failure.
Figure 3. Maximum Power Dissipation vs. Temperature for a 4-Layer Board
Airflow increases heat dissipation, effectively reducing θJA. Also,
more metal directly in contact with the package leads from
metal traces, through holes, ground, and power planes reduce
the θJA. Care must be taken to minimize parasitic capacitances
at the input leads of high speed op amps as discussed in the
Layout, Grounding, and Bypassing Considerations section.
The still air thermal properties of the package and PCB (θJA),
ambient temperature (TA), and total power dissipated in the
package (PD) determine the junction temperature of the die.
The junction temperature can be calculated by
Figure 3 shows the maximum safe power dissipation in the
package vs. the ambient temperature for the SOIC (125°C/W),
SOT-23 (180°C/W), and MSOP (150°C/W) packages on a
JEDEC standard 4-layer board. θJA values are approximations.
TJ = TA + (PD × θJA)
OUTPUT SHORT CIRCUIT
The power dissipated in the package (PD) is the sum of the
quiescent power dissipation and the power dissipated in the
package due to the load drive for all outputs. The quiescent
power is the voltage between the supply pins (VS) times the
quiescent current (IS). Assuming the load (RL) is referenced to
midsupply, then the total drive power is VS /2 × IOUT, some of
which is dissipated in the package and some in the load (VOUT ×
IOUT). The difference between the total drive power and the load
power is the drive power dissipated in the package.
Shorting the output to ground or drawing excessive current for
the AD8065/AD8066 will likely cause catastrophic failure.
ESD CAUTION
(
)
Power
Load
Power
Drive
Total
Power
Quiescent
PD
+
=
()
L
OUT
L
OUT
S
S
S
D
R
V
R
V
V
I
V
P
2
2
×
+
×
=


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