LM13700

SNOSBW2E – NOVEMBER 1999 – REVISED MARCH 2013

www.ti.com

Typical Performance Characteristics (continued)

Figure 20. Leakage Current Test Circuit

Figure 21. Differential Input Current Test Circuit

Circuit Description

is defined by the differential input voltage according to the transfer function:

(1)

(2)

can be approximated as:

(3)

(4)

(5)

Linearizing Diodes

For differential voltages greater than a few millivolts, Equation 3 becomes less valid and the transconductance

becomes increasingly nonlinear. Figure 22 demonstrates how the internal diodes can linearize the transfer

function of the amplifier. For convenience assume the diodes are biased with current sources and the input

can be written as follows:

(6)

Since the diodes and the input transistors have identical geometries and are subject to similar voltages and

temperatures, the following is true:

8

Submit Documentation Feedback

Copyright © 1999–2013, Texas Instruments Incorporated

Product Folder Links: LM13700