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LMV614MAXNOPB データシート(PDF) 6 Page - National Semiconductor (TI) |
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LMV614MAXNOPB データシート(HTML) 6 Page - National Semiconductor (TI) |
6 / 28 page LMV611, LMV612, LMV614 SNOSC69B – APRIL 2012 – REVISED MARCH 2013 www.ti.com 5V DC Electrical Characteristics Unless otherwise specified, all limits ensured for TJ = 25°C. V + = 5V, V − = 0V, V CM = V +/2, V O = V +/2 and R L > 1 MΩ. Boldface limits apply at the temperature extremes. See (1) Symbol Parameter Condition Min(2) Typ(3) Max(2) Units VOS Input Offset Voltage LMV611 (Single) 1 4 mV LMV612 (Dual) 1 5.5 mV LMV614 (Quad) TCVOS Input Offset Voltage Average 5.5 μV/°C Drift IB Input Bias Current 14 35 nA IOS Input Offset Current 9 nA IS Supply Current (per channel) 116 210 μA CMRR Common Mode Rejection Ratio 0 ≤ VCM ≤ 3.8V 60 86 4.6V ≤ VCM ≤ 5.0V (4) dB −0.2V ≤ VCM ≤ 0V 50 78 5.0V ≤ VCM ≤ 5.2V PSRR Power Supply Rejection Ratio 1.8V ≤ V+ ≤ 5V 100 dB VCM = 0.5V CMVR Input Common-Mode Voltage For CMRR Range TA = 25°C V− −0.2 −0.2 to 5.3 V+ +0.2 Range ≥ 50dB TA = −40°C to V− V+ V 85°C TA = 125°C V− +0.3 V+ −0.3 AV Large Signal Voltage Gain RL = 600Ω to 2.5V, 88 102 LMV611 (Single) VO = 0.2V to 4.8V dB RL = 2kΩ to 2.5V, 94 113 VO = 0.2V to 4.8V Large Signal Voltage Gain RL = 600Ω to 2.5V, 81 90 LMV612 (Dual) VO = 0.2V to 4.8V dB LMV614 (Quad) RL = 2kΩ to 2.5V, 85 100 VO = 0.2V to 4.8V VO Output Swing RL = 600Ω to 2.5V 4.855 4.890 VIN = ±100mV 0.120 0.160 V RL = 2kΩ to 2.5V 4.945 4.967 VIN = ±100mV 0.037 0.065 IO Output Short Circuit Current(5) LMV611, Sourcing, VO = 0V 100 VIN = 100mV mA Sinking, VO = 5V 65 VIN = −100mV (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No assurance of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. See Applications section for information of temperature derating of the device. Absolute Maximum Ratings indicated junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) All limits are specified by testing or statistical analysis. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) For specified temperature ranges, see Input Common-Mode Voltage Range specifications. (5) Applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature of 150°C. Output currents in excess of 45mA over long term may adversely affect reliability. 6 Submit Documentation Feedback Copyright © 2012–2013, Texas Instruments Incorporated Product Folder Links: LMV611 LMV612 LMV614 |
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