LMV981-N, LMV982-N

SNOS976L – NOVEMBER 2001 – REVISED MARCH 2013

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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1) (2)

Machine Model

200V

Human Body Model

2000V

5.5V

Differential Input Voltage

± Supply Voltage

Voltage at Input/Output Pins

Storage Temperature Range

−65°C to 150°C

150°C

For soldering specifications:

http://www.ti.com/lit/SNOA549f

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test

conditions, see the Electrical Characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and

specifications.

(3)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC) Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(4)

Operating Ratings

(1)

Supply Voltage Range

1.8V to 5.0V

Temperature Range

−40°C to 125°C

Thermal Resistance (

6-Bump DSBGA

286°C/W

SC70-6

414°C/W

SOT-23-6

265°C/W

VSSOP-10

235°C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test

conditions, see the Electrical Characteristics.

1.8V DC Electrical Characteristics

tied to V

Parameter

Test Conditions

Units

Input Offset Voltage

LMV981-N (Single)

1

4

6

mV

LMV982 (Dual)

1

5.5

7.5

Input Offset Voltage Average Drift

5.5

μV/°C

Input Bias Current

15

35

nA

50

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

this device. Absolute Maximum Ratings indicated junction temperature limits beyond which the device may be permanently degraded,

either mechanically or electrically.

(2)

All limits are specified by testing or statistical analysis.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

2

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