2SK2357/2SK2358

7

REFERENCE

Document Name

Document No.

NEC semiconductor device reliability/quality control system.

C11745E

Quality grades on NEC semiconductor devices.

C11531E

Semiconductor device mounting technology manual.

C10535E

IC package manual.

C10943X

Guide to quality assurance for semiconductor devices.

MEI-1202

Semiconductor selection guide.

X10679E

Power MOS FET features and application switching to power supply.

D12971E

Application circuits using Power MOS FET.

D12972E

Safe operating area of Power MOS FET.

D13085E

The diode connected between the gate and source of the transistor serves as a protector against ESD. When this

device is actually used, an additional protection circuit is externally required if a voltage exceeding the

rated voltage may be applied to this device.