LMV112_14 datasheet(5/19 Pages) TI1

部品番号	LMV112

部品情報	40 MHz Dual Clock Buffer

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LMV112

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SNAS297A – JUNE 2005 – REVISED JULY 2005

5V Electrical Characteristics

Unless otherwise specified, all limits are guaranteed for TJ = 25°C, VDD = 5V, VSS = 0V, VCM = 1V, Enable1,2 = VDD, CL = 20

pF, RL = 30 kΩ, CCOUPLING = 1 nF. Boldface limits apply at temperature range extremes of operating condition. See

(1)

Symbol

Parameter

Conditions

Min

Typ

Max

Units

(2)

(3)

(2)

Frequency Domain Response

SSBW

Small Signal Bandwidth

VIN = 0.63 VPP; −3 dB

42

MHz

FPBW

Full Power Bandwidth

VIN = 1.6 VPP; −3 dB

31

MHz

GFN

Gain Flatness < 0.1 dB

f > 100 kHz

4.9

MHz

Distortion and Noise Performance

en

Input-Referred Voltage Noise

f = 1 MHz

27

nV/

ISOLATION

Output to Input

f = 1 MHz

90

dB

CT

Crosstalk Rejection

f = 26 MHz, PIN = 0 dBm

61

dB

Time Domain Response

tr

Rise Time

0.1 VPP Step (10-90%), f = 1 MHz

7

ns

tf

Fall Time

6

ns

ts

Settling Time to 0.1%

1 VPP Step, f = 1 MHz

80

ns

OS

Overshoot

0.1VPP Step, f = 1 MHz

20

%

SR

Slew Rate (4)

VIN = 1.6 VPP, f = 26 MHz

120

V/µs

Static DC Performance

IS

Supply Current

Enable1,2 = VDD ; No Load

3.5

2.5

mA

3.8

Enable1,2 = VSS ; No Load

80

62

μA

89

PSRR

Power Supply Rejection Ratio

DC (3.0V to 5.0V)

58

68

dB

57

ACL

Small Signal Voltage Gain

VOUT = 0.1 VPP

0.99

1.01

1.00

V/V

0.97

1.03

VOS

Output Offset Voltage

16

1.3

mV

17

TC VOS

Temperature Coefficient Output Offset

3

µV/°C

Voltage (5)

ROUT

Output Resistance

f = 100 kHz

0.5

Ω

f = 26 MHz

118

Miscellaneous Performance

RIN

Input Resistance per Buffer

Enable = VDD

134

k

Ω

Enable = VSS

134

CIN

Input Capacitance per Buffer

Enable = VDD

2.0

pF

Enable = VSS

2.0

ZIN

Input Impedance

f = 26 MHz, Enable = VDD

7.2

k

Ω

f = 26 MHz, Enable = VSS

8.0

VO

Output Swing Positive

VIN = VDD

4.96

4.99

V

4.94

Output Swing Negative

VIN = VSS

40

10

mV

55

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA . There is no guarantee of parametric performance as indicated in the electrical

tables under conditions of internal self-heating where TJ > TA.

(2)

All limits are guaranteed by testing or statistical analysis.

(3)

Typical Values represent the most likely parametric norm.

(4)

Slew rate is the average of the positive and negative slew rate.

(5)

Average Temperature Coefficient is determined by dividing the changing in a parameter at temperature extremes by the total

temperature change.

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