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LM119J883 データシート(PDF) 4 Page - Texas Instruments |
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LM119J883 データシート(HTML) 4 Page - Texas Instruments |
4 / 26 page LM119QML SNOSAN3B – JULY 2008 – REVISED MARCH 2013 www.ti.com Table 1. Quality Conformance Inspection(1) Subgroup Description Temp °C 1 Static tests at 25 2 Static tests at 125 3 Static tests at -55 4 Dynamic tests at 25 5 Dynamic tests at 125 6 Dynamic tests at -55 7 Functional tests at 25 8A Functional tests at 125 8B Functional tests at -55 9 Switching tests at 25 10 Switching tests at 125 11 Switching tests at -55 12 Settling time at 25 13 Settling time at 125 14 Settling time at -55 (1) Mil-Std-883, Method 5005 - Group 5 4 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: LM119QML |
同様の部品番号 - LM119J883 |
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同様の説明 - LM119J883 |
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