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データシートサーチシステム |
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データシートサーチシステム |
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BTB06-600B データシート(PDF) 5 Page - Kersemi Electronic Co., Ltd. |
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BTB06-600B データシート(HTML) 5 Page - Kersemi Electronic Co., Ltd. |
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5 / 5 page  Fig. 7: Relative variation of gate trigger current, holding current and latching current versus junction temperature (typical values). Fig. 8-1: Relative variation of critical rate of decrease of main current versus (dV/dt)c (typical values). Snubberless & Logic Level Types Fig. 8-2: Relative variation of critical rate of decrease of main current versus (dV/dt)c (typical values). Standard Types Fig. 9: Relative variation of critical rate of decrease of main current versus junction temperature. -40 -20 0 20 40 60 80 100 120 140 0.0 0.5 1.0 1.5 2.0 2.5 IGT,IH,IL[Tj] / IGT,IH,IL [Tj=25°C] IGT IH & IL Tj(°C) 0.1 1.0 10.0 100.0 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 (dI/dt)c [(dV/dt)c] / Specified (dI/dt)c BW/CW SW TW (dV/dt)c (V/µs) 0.1 1.0 10.0 100.0 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 (dI/dt)c [(dV/dt)c] / Specified (dI/dt)c C B (dV/dt)c (V/µs) 0 25 50 75 100 125 0 1 2 3 4 5 6 (dI/dt)c [Tj] / (dI/dt)c [Tj specified] Tj(°C) BTA/BTB06 Series 2014-6-9 5 www.kersemi.com |
同様の部品番号 - BTB06-600B |
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同様の説明 - BTB06-600B |
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