データシートサーチシステム |
|
74AHC_AHCT2G241 データシート(PDF) 10 Page - NXP Semiconductors |
|
74AHC_AHCT2G241 データシート(HTML) 10 Page - NXP Semiconductors |
10 / 17 page 74AHC_AHCT2G241 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved. Product data sheet Rev. 3 — 13 May 2013 10 of 17 NXP Semiconductors 74AHC2G241; 74AHCT2G241 Dual buffer/line driver; 3-state Test data is given in Table 10. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 8. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 10. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74AHC2G241 VCC 3 ns 15 pF, 50 pF 1 k open GND VCC 74AHCT2G241 3 V 3 ns 15 pF, 50 pF 1 k open GND VCC |
同様の部品番号 - 74AHC_AHCT2G241_15 |
|
同様の説明 - 74AHC_AHCT2G241_15 |
|
|
リンク URL |
プライバシーポリシー |
ALLDATASHEET.JP |
ALLDATASHEETはお客様のビジネスに役立ちますか? [ DONATE ] |
Alldatasheetは | 広告 | お問い合わせ | プライバシーポリシー | リンク交換 | メーカーリスト All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |